LINE X TESTER ANALYSIS FOR GRAIN YIELD AND ITS COMPONENTS IN BREAD WHEAT .

Abstract: This study was carried out during two Successive Seasons 2002/2003 and 2003 / 2004 at Al - Gemmeiza Agricultural Research Station to evaluate six wheat lines which were crossed with three new local wheat cultivars as a testers to produce 18 crosses, using line x tester analysis outlined by Kempthorne (1957) .The characters studied were, number of days to heading, plant height (CM), number of spikes / plant, spike length, number of spikeletes/ spike , maturity date, main calm ear weight, 1000 - grain weight and grain yield / plant General and specific combining ability variances, gene effects, and the characters studied were estimated as described by Mather and Jinks (1982). The studied genotypes ie. Parents, parents vs crosses, crosses, lines, testers and lines x testers testers exhibited highly significant variance for all traits studied except for., number of spiks / plant and maturity date of parent vs cross, plant height, number of spike of testers and spike length, maturity date of lines x testers .
The result revealed that the non additive gene effects were larger than those of the additive and played the major role in the inheritance of all traits studied The parental lines P1, P6, P3 were the best combiners for yield and yield components and lines 2,5,6 were detected to be good combiners for shortness and the three parental lines 1,2,4 for earliness and might be selected as a parental materials to develop hight yielding capacity wheat varieties in breeding programs .
Key words : Wheat, additive, gene action, line - tester, correlation .





Publication year 2006
Pages 75:87
Availability location 9 شارع الجامعة- الجيزة
Availability number
Organization Name
serial title Minufiya. J. Agric. Res. :
Author(s) from ARC
Agris Categories Agriculture - General aspects
AGROVOC
TERMS
Grain. Soft wheat.
Publication Type Journal